SR. RELIABILITY ENGINEER / RELIABILITY DEVELOPMENT ENGINEER
Seeking a fulfilling position as a Reliability Engineer that allows me to utilize my skills and experience in the semiconductor industry Detail planning and execution of reliability test to qualify new product, chip and packaging materials of high power Chip On Board Light Emitting Diode (LED) array
*Failure analysis to determine root cause of catastrophic failure and lumen degradation of LED array
*Experienced working with outside vendors to complete necessary reliability tests
*Defined metrics for ORT test of production materials at CM site
*Increased reliability test capacity by two fold to support demand by acquiring and qualifying new equipments
*Extensive experience with IES-LM80-08/15 testing and publishing formal report for customers
*Lifetime calculations of high power LED arrays based on IES-TM21-11 method
*Led a project with IT application team to design a web based database for complete automation of reliability test data collection process
*Proven problem solving and project management experience
*Excellent communication, written and interpersonal skills
*Effective team leader and team player
Accelerated life test -Environmental tests -Thermal cycling/Shock
NPI qualification -Statistical data analysis -Failure Analysis
Design of Experiments (DOE) -Statistical Process Control -Six Sigma Green Belt
FMEA -Gage R&R -ISO17025
Lifetime calculation -IES-LM80 test -Measurement Uncertainty (MU)
JMP/Weibull++ -SQL/Python programming -Electrical/Optical tester calibration JMP, Weibull++, MINITAB, MS Word, MS Excel, MS PowerPoint, MS Visio, MS project
Sr. Reliability Engineer / Reliability Development Engineer01/2011 to 01/2017Bridgelux IncLivermore, CA
Accelerated life test, thermal cycling/shock and environmental tests to qualify high power LED arrays.
Summarize and present reliability test result to improve product design and qualify new products.
Calibration of the automated electrical/optical test equipment of high power LED arrays.
JMP and Weibull++ statistical software for detail data and lifetime analysis.
Utilize SQL (Structured Query Language) to analyze large volume of reliability test data.
Statistical Process Control (SPC) to monitor critical electrical /optical parameters of the test equipment utilizing JMP statistical software and SQL.
Achieved ISO 17025 accreditation, so long term lumen maintenance IES-LM80 testing can be done internally.
Measurement Uncertainty (MU) estimation of automated LED array tester to fulfill ISO 17025 audit requirement.
Staff Engineer01/2009 to 01/2011Solar Junction IncSan Jose, CA
Hands on material characterization (Surfscan, PL, XRD and ECV) of the post epitaxial wafers and responsible for the analysis of the characterization data used to verify material quality.
Utilized Design of Experiments (DOE) to optimize and implement a critical rapid thermal annealing (RTA) process of the post epitaxial wafers in order to improve material quality and efficiency of the solar cells.
Improved the Voc of the multi junction solar cells by 10-15mV at a high concentration of suns by the optimization of the RTA process parameters.
Reduced post RTA wafer bow by 12% which resulted in a tighter bin distribution of the solar cell efficiency.
Implemented Statistical Process Control (SPC) to monitor material characterization parameters utilizing JMP statistical software.
Measurement system analysis (Gage R&R) of the key parameters to study repeatability and reproducibility of the material characterization tool.
In depth statistical analysis of wafer to wafer and run to run variations of the material parameters of the deposition runs of the reactors to gauge the repeatability of the III-V deposition processes then reported the findings to the management team.
Sr. MOCVD Process Engineer / MOCVD Process Engineer01/2000 to 01/2009Philips Lumileds LightingSan Jose, CA
Primary ownership of multi-wafer high capacity MOCVD (Metal Organic Chemical Vapor Deposition) reactors to produce III-V nitride epitaxial wafers to meet production demands.
Analyzed material characterization data (Candela, PL, XRD, SIMS) and quick engineering evaluation test data to ensure production material quality specifications were met.
Led manufacturing process verification projects to transfer from developmental work to high volume production.
Modified and edited production growth recipes to produce desired epitaxial wafers to meet production demand for high power and high brightness nitride LED's.
Six Sigma Green Belt project which improved within a wafer color non-uniformity, resulting in a 45% reduction in reject rate.
Reviewed SPC charts on the production floor to monitor all critical parameters of the epi processes.
Created OCAPs (Out of Control Action Plans) for critical process parameters.
Established process capabilities by measuring Cpk of key process indicators.
Wrote procedures for production personnel and coordinated with technicians and operators to ensure smooth operations of the MOCVD reactors at optimal level.
Process engineer01/1997 to 01/2000Tecstar IncCity of Industry, CA
Process engineering support to the high volume manufacturing of GaInP/GaAs/Ge solar cell epitaxial group.
Experiments to reclaim rejected epitaxial wafers by etching single junction GaAs deposition.
Analyzed engineering solar cell device data on daily basis in order to disposition wafers for fabrication processes.
Coordinated troubleshooting of the MOCVD reactors with the maintenance group.
Education and Training
Bachelor of Science: Chemical EngineeringCAL POLYPomonaChemical Engineering
Foundations of Reliability Engineering Data Analysis and Modeling by ReliaSoft
Photometry Short Course at NIST
Practical Measurement Uncertainty by ASQ
Calibration, charts, color, data analysis, Data Analysis and Modeling, Design of Experiments (DOE), Design of Experiments (DOE), Experiments, Failure Analysis, ISO, manufacturing process, MS Excel, MS PowerPoint, MS project, MS Word, MINITAB, optimization, personnel, PL, Process engineering, processes, improve product, PROGRAMMING, Python, quality, quick, requirement, SIMS, Six Sigma, SPC, SQL, Structured Query Language, Statistical Process Control, statistical analysis, system analysis, test equipment, troubleshooting, Visio