Design-for-Test (DFT) specialist and dedicated team player with extensive knowledge of DFT concepts and hands-on expertise with the deployment and implementation of various advanced DFT techniques for low power, high performance and highly integrated SoCs.
Designed and implemented electrical equipment, facilities and systems for commercial and domestic purposes.
Design and implement a VLSI diagnosis tool that can efficiently diagnose open and short defects in circuits
Resolved the fault counting problem - that different ATPG vendors disagree on the fault list and fault coverage metrics
Dissertation: An Efficient Logic Fault Diagnosis Framework Based on Effect-Cause Approach
Advisor: Duncan M. (Hank) Walker
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