Design-for-Test (DFT) specialist and dedicated team player with extensive knowledge of DFT concepts and hands-on expertise with the deployment and implementation of various advanced DFT techniques for low power, high performance and highly integrated SoCs.
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Designed and implemented electrical equipment, facilities and systems for commercial and domestic purposes.
Design and implement a VLSI diagnosis tool that can efficiently diagnose open and short defects in circuits
Resolved the fault counting problem - that different ATPG vendors disagree on the fault list and fault coverage metrics
Dissertation: An Efficient Logic Fault Diagnosis Framework Based on Effect-Cause Approach
Advisor: Duncan M. (Hank) Walker
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